Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Characterization of atomic-beam deposited GeO1-xNx/HfO2 stacks on Ge
Publication:
Characterization of atomic-beam deposited GeO1-xNx/HfO2 stacks on Ge
Date
2005
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, Michel
;
Conard, Thierry
;
Van Steenbergen, Jan
;
Mavrou, G.
;
Panayiotatos, Y.
;
dimoulas, A.
;
Meuris, Marc
;
Caymax, Matty
;
Heyns, Marc
Journal
Abstract
Description
Metrics
Views
1911
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1911
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations