Browsing by Author "Mendes Almeida, Luciano"
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Publication Defect analysis in UTBOX SOI nMOSFETs by low-frequency noise
Publication Effect of interface states on 1T-FBRAM cell retention
Proceedings paper2012, IEEE International Reliability Physics Symposium - IRPS, 15/04/2012, p.MY-1Publication Junction field effect on the retention time for one-transistor floating-body RAM
Journal article2012, IEEE Transactions on Electron Devices, (59) 8, p.2167-2172Publication On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs
Proceedings paper2012, 42nd European Solid-State Device Research Conference - ESSDERC, 17/09/2012, p.338-341Publication On the variability of the low-frequency noise in UTBOX SOI nMOSFETs
Proceedings paper2012, Proceedings of the 27th Symposium on Microelectronics Technology and Devices - SBMicro, 30/08/2012, p.51-58Publication On the variability of the low-frequency noise in UTBOX SOI nMOSFETs
Journal article2013, Journal of Integrated Circuits and Systems, (8) 2, p.71-77Publication Optimizing the front and back biases for the best sense margin and retention time in UTBOX FBRAM
Journal article2013, Solid-State Electronics, 90, p.149-154