Publication:

On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1937 since deposited on 2021-10-20
Acq. date: 2025-12-10

Citations

Metrics

Views

1937 since deposited on 2021-10-20
Acq. date: 2025-12-10

Citations