Browsing by Author "Meneghesso, Gaudio"

Breakdown investigation in GaN-based MIS-HEMT devices

Impact of gate insulator on the dc and dynamic performance of AlGaN/GaN MIS-HEMTs

Negative bias-induced threshold voltage instability (NBTI) in GaN-on-Si power HEMTs

Trapping in GaN-based MIS-HEMTs: role of high drain bias and hot electrons