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Breakdown investigation in GaN-based MIS-HEMT devices
Publication:
Breakdown investigation in GaN-based MIS-HEMT devices
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Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marino, Fabio
;
Bisi, Davide
;
Meneghini, Matteo
;
Verzellesi, Giovanni
;
Zanoni, Enrico
;
Van Hove, Marleen
;
You, Shuzhen
;
Decoutere, Stefaan
;
Marcon, Denis
;
Stoffels, Steve
;
Ronchi, Nicolo
;
Meneghesso, Gaudio
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1995
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations
Metrics
Views
1995
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations