Browsing by Author "Michl, J."
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Publication A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
Proceedings paper2023, 7th IEEE Electron Devices Technology and Manufacturing Conference (EDTM), MAR 07-10, 2023Publication Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS
Proceedings paper2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021Publication Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures
Publication Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures
Proceedings paper2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020Publication Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors
Proceedings paper2022, IEEE International Reliability Physics Symposium (IRPS), MAR 27-31, 2022