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Browsing by Author "Mikolajick, T."

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    Ferroelectricity in Gd:HfO2 thin films

    Mueller, Stefan
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    Adelmann, Christoph  
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    Singh, A.
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    Van Elshocht, Sven  
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    Schroeder, Uwe
    Journal article
    2012-10, ECS Journal of Solid State Science and Technology, (1) 6, p.N123-N126
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    Local doping profiles for height-selective emitters determined by Scanning Spreading Resistance Microscopy (SSRM)

    Ferrada, Pablo
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    Harney, R.
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    Wefringhaus, E.
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    Doering, S.
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    Jakschick, S.
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    Mikolajick, T.
    Journal article
    2013, IEEE Journal of Photovoltaics, (3) 1, p.168-174
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    Non-volatile data storage in 28nm ferroelectric FETs

    Schroeder, U.
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    Mueller, J.
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    Yurchuk, E.
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    Mueller, S.
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    Martin, D.
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    Adelmann, Christoph  
    Meeting abstract
    2012, 17th Workshop on Dielectrics in Microelectronics - WoDiM, 25/06/2012
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    Searching for the origin of the ferroelectric phase in HfO2

    Schroeder, Uwe
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    Schenk, T.
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    Richter, C.
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    Hoffmann, M.
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    Martin, D.
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    Shimizu, T.
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    Funakubo, H.
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    Pohl, D.
    Oral presentation
    2015, IEEE International Symposium on Applications of Ferroelectric - ISAF
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    Stabilizing the ferroelectric phase in doped hafnium oxide

    Hoffmann, M.
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    Schroeder, Uwe
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    Schenk, Tony
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    Shimizu, T
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    Funakubo, H.
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    Sakata, O.
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    Pohl, D.
    Journal article
    2015, Journal of Applied Physics, (118) 7, p.72006
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    Strontium doped hafnium oxide thin films: wide process window for ferroelectric memories

    Schenk, Tony
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    Mueller, S.
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    Schroeder, Uwe
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    Materlik, R.
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    Kersch, A.
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    Popovici, Mihaela Ioana  
    Proceedings paper
    2013, 43rd European Solid State Device Research Conference - ESSDERC, 16/09/2013, p.260-263

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