Browsing by Author "Mohammadzadeh, A."
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Publication 60 MeV proton irradiation effects on NO-annealed and standard-oxide deep submicron MOSFETs
Oral presentation2001, RADECS; 10-14 September 2001; Grenoble, France.Publication Comparison of the total dose and 60MeV proton-irradiation response of CMOS transistors operated at 4.2K
Oral presentation1999, RADECS '99; 13-17 September 1999; Abbaye de Fontevraud, France.Publication Comparison of the total dose and 60MeV proton-irradiation response of CMOS transistors operated at 4.2K
Proceedings paper2000, 1999 5th European Conference on Radiation and its Effects on Components and Systems - RADECS, 13/09/1999, p.535-541Publication Degradation of deep submicron partially depleted SOI CMOS transistors under MeV proton irradiation
Proceedings paper2003, Proceedings of the 18th Symposium on Microelectronics Technology and Devices - SBMICRO, 8/09/2003, p.18-27Publication Displacement damage effects after high energy proton irradiation in cryogenic MOSFETs for space applications
Proceedings paper2000, Proceedings of the RADECS Workshop - Les Actes des Journees Techniques du RADECS, 11/09/2000, p.47-53Publication Evidence for short-channel effect in the radiation response of 0.18μm CMOS transistors
Proceedings paper2000, Proceedings of the RADECS Workshop - Les Actes des Journees Techniques du RADECS, 11/09/2000, p.259-31Publication Guidelines for cryogenic spaceborn CMOS testing and optimization
Proceedings paper2000, 4th European Workshop on Low Temperature Electronics - WOLTE-4, 21/06/2000, p.13-20Publication High-energy boron-implantation and proton-irradiation effects in diodes with shallow trench isolation
Proceedings paper2000, Proceedings 2nd ENDEASD Workshop, 27/06/2000, p.193-203Publication Impact of 60 MeV proton irradiations on the 4.2K characteristics of 0.7 µm cryo CMOS transistors
Meeting abstract1999, Electrochemical Society Fall Meeting: 5th Symposium on Low Temperature Electronics, 17/10/1999, p.1192Publication Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 μm CMOS devices and read-out circuits
Oral presentation2003, 7th European Conference on Radiation and Its Effects on Components and Systems - RADECSPublication Proton radiation hardness of MOS transistors at cryogenic temperature
Meeting abstract1999, BNV- SBP. General Scientific Meeting. Program Overview, Plenary Invited Lectures, Oral and Poster communications, 20/05/1999, p.CM25Publication Radiation performance of deep submicron CMOS technologies for space applications
Proceedings paper2000, Proceedings of the 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, 11/10/2000, p.113-119Publication Radiation performance of shallow trench isolation
Proceedings paper2000, Proceedings of the 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, 11/10/2000, p.19-24Publication Radiation source dependence of degradation in shallow trench isolation diodes
Proceedings paper2000, Proceedings of the RADECS Workshop - Les Actes des Journees Techniques du RADECS, 11/09/2000, p.32-35Publication Radiation-induced back channel leakage in MeV-proton-irradiated 0.10 mm-CMOS partially depleted SOI MOSFETs
Oral presentation2003, 7th European Conference on Radiation and Its Effects on Components and Systems - RADECSPublication Radiation-induced back-channel leakage in 60 MeV proton irradiation 0.10 μm CMOS partially depleted SOI MOSFETs
Proceedings paper2004, Proceedings 7th European Conference on Radiation and its Effects on Components and Systems, 15/09/2003, p.425-432Publication Semi-empirical modelling of the multiplication current in n-MOSFETs operating at liquid-helium temperature
Meeting abstract2000, Belgische Natuurkundige Vereniging / Société Belge de Physique: General Scientific Meeting, 25/05/2000, p.CM40Publication Short-channel radiation effect in 60 MeV proton irradiated 0.13 μm CMOS transistors
Oral presentation2002, RADECS WorkshopPublication Short-channel radiation effect in 60 MeV proton irradiated 0.13 μm CMOS transistors
Journal article2003, IEEE Trans. Nuclear Science, (50) 6, p.2426-2432Publication Substrate current and kink analysis of MOSFETs at liquid helium temperatures
Proceedings paper2000, 4th European Workshop on Low Temperature Electronics - WOLTE-4, 21/06/2000, p.265-270