Browsing by Author "Mohammadzadeh, A."
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Publication 60 MeV proton irradiation effects on NO-annealed and standard-oxide deep submicron MOSFETs
Oral presentation2001, RADECS; 10-14 September 2001; Grenoble, France.Publication Comparison of the total dose and 60MeV proton-irradiation response of CMOS transistors operated at 4.2K
Oral presentation1999, RADECS '99; 13-17 September 1999; Abbaye de Fontevraud, France.Publication Comparison of the total dose and 60MeV proton-irradiation response of CMOS transistors operated at 4.2K
Proceedings paper2000, 1999 5th European Conference on Radiation and its Effects on Components and Systems - RADECS, 13/09/1999, p.535-541Publication Degradation of deep submicron partially depleted SOI CMOS transistors under MeV proton irradiation
Proceedings paper2003, Proceedings of the 18th Symposium on Microelectronics Technology and Devices - SBMICRO, 8/09/2003, p.18-27Publication Displacement damage effects after high energy proton irradiation in cryogenic MOSFETs for space applications
Proceedings paper2000, Proceedings of the RADECS Workshop - Les Actes des Journees Techniques du RADECS, 11/09/2000, p.47-53Publication Evidence for short-channel effect in the radiation response of 0.18μm CMOS transistors
Proceedings paper2000, Proceedings of the RADECS Workshop - Les Actes des Journees Techniques du RADECS, 11/09/2000, p.259-31Publication Guidelines for cryogenic spaceborn CMOS testing and optimization
Proceedings paper2000, 4th European Workshop on Low Temperature Electronics - WOLTE-4, 21/06/2000, p.13-20Publication High-energy boron-implantation and proton-irradiation effects in diodes with shallow trench isolation
Proceedings paper2000, Proceedings 2nd ENDEASD Workshop, 27/06/2000, p.193-203Publication Impact of 60 MeV proton irradiations on the 4.2K characteristics of 0.7 µm cryo CMOS transistors
Meeting abstract1999, Electrochemical Society Fall Meeting: 5th Symposium on Low Temperature Electronics, 17/10/1999, p.1192Publication Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 μm CMOS devices and read-out circuits
Oral presentation2003, 7th European Conference on Radiation and Its Effects on Components and Systems - RADECSPublication Proton radiation hardness of MOS transistors at cryogenic temperature
Meeting abstract1999, BNV- SBP. General Scientific Meeting. Program Overview, Plenary Invited Lectures, Oral and Poster communications, 20/05/1999, p.CM25Publication Radiation performance of deep submicron CMOS technologies for space applications
Proceedings paper2000, Proceedings of the 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, 11/10/2000, p.113-119Publication Radiation performance of shallow trench isolation
Proceedings paper2000, Proceedings of the 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, 11/10/2000, p.19-24Publication Radiation source dependence of degradation in shallow trench isolation diodes
Proceedings paper2000, Proceedings of the RADECS Workshop - Les Actes des Journees Techniques du RADECS, 11/09/2000, p.32-35Publication Radiation-induced back channel leakage in MeV-proton-irradiated 0.10 mm-CMOS partially depleted SOI MOSFETs
Oral presentation2003, 7th European Conference on Radiation and Its Effects on Components and Systems - RADECSPublication Radiation-induced back-channel leakage in 60 MeV proton irradiation 0.10 μm CMOS partially depleted SOI MOSFETs
Proceedings paper2004, Proceedings 7th European Conference on Radiation and its Effects on Components and Systems, 15/09/2003, p.425-432Publication Semi-empirical modelling of the multiplication current in n-MOSFETs operating at liquid-helium temperature
Meeting abstract2000, Belgische Natuurkundige Vereniging / Société Belge de Physique: General Scientific Meeting, 25/05/2000, p.CM40Publication Short-channel radiation effect in 60 MeV proton irradiated 0.13 μm CMOS transistors
Journal article2003, IEEE Trans. Nuclear Science, (50) 6, p.2426-2432Publication Short-channel radiation effect in 60 MeV proton irradiated 0.13 μm CMOS transistors
Oral presentation2002, RADECS WorkshopPublication Substrate current and kink analysis of MOSFETs at liquid helium temperatures
Proceedings paper2000, 4th European Workshop on Low Temperature Electronics - WOLTE-4, 21/06/2000, p.265-270