Browsing by Author "Monta, Kazuki"
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Publication Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements
Journal article2022, IEEE DESIGN & TEST, (39) 5, p.79-87Publication Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring
Proceedings paper2021, 26th IEEE European Test Symposium (ETS), MAY 24-28, 2021