Publication:

Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements

Date

2022
Journal article
https://doi.org/10.1109/MDAT.2022.3178050
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Accepted version 792.36 KB

Author(s)

Monta, Kazuki
;
Katselas, Leonidas
;
Fodor, Ferenc  
;
Miki, Takuji
;
Hatzopoulos, Alkis
;
Nagata, Makoto
;
Marinissen, Erik Jan  

Journal

IEEE DESIGN & TEST

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183 since deposited on 2022-09-16
Acq. date: 2025-10-25

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1453 since deposited on 2022-09-16
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183 since deposited on 2022-09-16
Acq. date: 2025-10-25

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1453 since deposited on 2022-09-16
Acq. date: 2025-10-25

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