Publication:

Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements

Date

2022
Journal article
https://doi.org/10.1109/MDAT.2022.3178050
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dc.contributor.authorMonta, Kazuki
dc.contributor.authorKatselas, Leonidas
dc.contributor.authorFodor, Ferenc
dc.contributor.authorMiki, Takuji
dc.contributor.authorHatzopoulos, Alkis
dc.contributor.authorNagata, Makoto
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.imecauthorFodor, Ferenc
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.date.accessioned2022-12-01T15:32:59Z
dc.date.available2022-09-16T02:50:10Z
dc.date.available2022-12-01T15:32:59Z
dc.date.embargo2022-10-31
dc.date.issued2022
dc.description.wosFundingTextThis work was supported by JSPS KAKENHI under Grant JP22H04999.
dc.identifier.doi10.1109/MDAT.2022.3178050
dc.identifier.issn2168-2356
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40435
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage79
dc.source.endpage87
dc.source.issue5
dc.source.journalIEEE DESIGN & TEST
dc.source.numberofpages9
dc.source.volume39
dc.title

Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements

dc.typeJournal article
dspace.entity.typePublication
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