Browsing by Author "Moors, Kristof"

Ab initio screening of metallic MAX ceramics for advanced interconnect applications

Alternative metals: from ab initio screening to calibrated narrow line models

Analytic solution of Ando's surface roughness model with finite domain distribution functions

Electron relaxation times and resistivity in metallic nanowires due to tilted grain boundary planes

Electron transport and resistivity scaling in nanostructures

Fabry-Perot interferometry with gate-tunable 3D topological insulator nanowires

Finite size effects in highly scaled ruthenium interconnects

First-principles-based screening method for resistivity scaling of anisotropic metals

Modeling and tackling resistivity scaling in metal nanowires

Modeling surface roughness scattering in metallic nanowires

On-chip interconnect trends, challenges and solutions: how to keep RC and reliability under control

Resistivity scaling and electron relaxation times in metallic nanowires

Resistivity scaling in metallic thin films and nanowires due to grain boundary and surface roughness scattering

Resistivity scaling model for metals with conduction band anisotropy

Temperature-dependent resistivity of alternative metal thin films

Thickness dependence of the resistivity of platinum-group metal thin films

Thin film resistivity scaling of metals with conduction band anisotropy

Validity criteria for Fermi's golden rule scattering rates applied to metallic nanowires

Validity criteria for scattering rates obtained with Fermi's golden rule in semi-classical transport