On-chip interconnect trends, challenges and solutions: how to keep RC and reliability under control

Simple item page Full metadata Statistics

Files

33931.pdf 631.52 KB

Author(s)

;

;

Roussel, Philippe

;

Debacker, Peter

;

Raghavan, Praveen

;

van der Veen, Marleen

;

Jourdan, Nicolas

;

;

Vega Gonzalez, Victor

;

Adelmann, Christoph

;

Wen, Liang Gong

;

;

Varela Pedreira, Olalla

;

;

Krishtab, Mikhail

;

;

Boemmels, Juergen

Metrics

1 since deposited on 2021-10-23

Acq. date: 2025-10-24

1919 since deposited on 2021-10-23

Acq. date: 2025-10-24