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Conference contributions
On-chip interconnect trends, challenges and solutions: how to keep RC and reliability under control
Publication:
On-chip interconnect trends, challenges and solutions: how to keep RC and reliability under control
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Date
2016
Proceedings Paper
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33931.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tokei, Zsolt
;
Ciofi, Ivan
;
Roussel, Philippe
;
Debacker, Peter
;
Raghavan, Praveen
;
van der Veen, Marleen
;
Jourdan, Nicolas
;
Wilson, Chris
;
Vega Gonzalez, Victor
;
Adelmann, Christoph
;
Wen, Liang Gong
;
Croes, Kristof
;
Varela Pedreira, Olalla
;
Moors, Kristof
;
Krishtab, Mikhail
;
Armini, Silvia
;
Boemmels, Juergen
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since deposited on 2021-10-23
Acq. date: 2025-12-10
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1923
since deposited on 2021-10-23
2
last month
Acq. date: 2025-12-09
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