Browsing by Author "Mouis, M."
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Publication DC and low frequency noise characterization of FINFET devices
Journal article2009, Solid-State Electronics, (53) 12, p.1263-1267Publication Electrical transport characterization of nano CMOS devices with ultra-thin silicon film
Publication Experimental characterization of the subthreshold leakage current in triple-gate FinFETs
Journal article2009, Solid-State Electronics, (53) 3, p.359-363Publication Static and low frequency noise characterization of FinFET devices
Proceedings paper2009, 10th International Conference on Ultimate Integration of Silicon - ULIS, 18/03/2009, p.39-42