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Experimental characterization of the subthreshold leakage current in triple-gate FinFETs
Publication:
Experimental characterization of the subthreshold leakage current in triple-gate FinFETs
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Date
2009
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tsormpatzoglou, A.
;
Dimitriadis, C.
;
Mouis, M.
;
Ghibaudo, G.
;
Collaert, Nadine
Journal
Solid-State Electronics
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1896
since deposited on 2021-10-18
Acq. date: 2025-12-12
Citations
Metrics
Views
1896
since deposited on 2021-10-18
Acq. date: 2025-12-12
Citations