Publication:
Experimental characterization of the subthreshold leakage current in triple-gate FinFETs
Date
| dc.contributor.author | Tsormpatzoglou, A. | |
| dc.contributor.author | Dimitriadis, C. | |
| dc.contributor.author | Mouis, M. | |
| dc.contributor.author | Ghibaudo, G. | |
| dc.contributor.author | Collaert, Nadine | |
| dc.contributor.imecauthor | Collaert, Nadine | |
| dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
| dc.date.accessioned | 2021-10-18T03:44:41Z | |
| dc.date.available | 2021-10-18T03:44:41Z | |
| dc.date.issued | 2009 | |
| dc.identifier.issn | 0038-1101 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16326 | |
| dc.source.beginpage | 359 | |
| dc.source.endpage | 363 | |
| dc.source.issue | 3 | |
| dc.source.journal | Solid-State Electronics | |
| dc.source.volume | 53 | |
| dc.title | Experimental characterization of the subthreshold leakage current in triple-gate FinFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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