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Browsing by Author "Mukherjee, Subhasish"

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    Automated design-for-test for 2.5D and 3D SICs

    Marinissen, Erik Jan  
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    Konijnenburg, Mario  
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    Deutsch, Sergej
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    Keller, Brion
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    Chickermane, Vivek
    Journal article
    2011-09, Chip Scale Review, (?) 5, p.18-22
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    Automation of 3D-DfT insertion

    Deutsch, Sergej
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    Chickermane, Vivek
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    Keller, Brion
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    Mukherjee, Subhasish
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    Konijnenburg, Mario  
    Proceedings paper
    2011-11, IEEE Asian Test Symposium - ATS, 21/11/2011
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    Automation of 3D-DfT insertion

    Deutsch, Sergej
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    Chickermane, Vivek
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    Keller, Brion
    ;
    Mukherjee, Subhasish
    ;
    Konijnenburg, Mario  
    Proceedings paper
    2011-09, IEEE International Workshop on Testing Three-Dimensional Stacked ICs- 3D-TEST, 22/09/2011
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    Automation of DfT for 3-D stacked die

    Beyne, Eric  
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    Konijnenburg, Mario  
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    Marinissen, Erik Jan  
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    Jensen, Lisa
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    Deutsch, Sergej
    Proceedings paper
    2011, 3-D Architectures for Semiconductor Integration and Packaging, 3-D ASIP, 12/12/2011
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    DfT architecture and ATPG for interconnect tests of JEDEC wide-IO DRAM memory-on-Logic 2.5D/3D-stacks

    Deutsch, Sergej
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    Chickermane, Vivek
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    Keller, Brion
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    Mukherjee, Subhasish
    ;
    Sood, Navdeep
    Proceedings paper
    2012-05, Cadence CDNLive! EMEA, 14/05/2012
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    DfT architecture and ATPG for interconnect tests of JEDEC wide-IO memory-on-logic die stacks

    Deutsch, Sergej
    ;
    Keller, Brion
    ;
    Chickermane, Vivek
    ;
    Mukherjee, Subhasish
    ;
    Sood, Navdeep
    Proceedings paper
    2012-11, IEEE International Test Conference - ITC, 6/11/2012, p.1-10
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    Implementation aspects of a 3D DfT architecture

    Deutsch, Sergej
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    Chickermane, Vivek
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    Keller, Brion
    ;
    Mukherjee, Subhasish
    ;
    Konijnenburg, Mario  
    Oral presentation
    2011, CDNLive! EMEA (Cadence Design Systems)

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