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Browsing by Author "Munteanu, D."

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    A simulation analysis of FIBL in decananometer double-gate MOSFETs with high-k gate dielectrics

    Autran, J.L.
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    Munteanu, D.
    ;
    Bescond, M.
    ;
    Houssa, Michel  
    ;
    Said, A.
    Journal article
    2005, Journal of Non-Crystalline Solids, (351) 21_23, p.1897-1901
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    Electrical characterization, modelling and simulation of MOS structures with high-k gate stacks

    Autran, J.L.
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    Munteanu, D.
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    Houssa, Michel  
    Book chapter
    2003
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    Electrical modeling and simulation of nanoscale MOS devices with a high-permittivity dielectric gate stack

    Autran, J.L.
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    Munteanu, D.
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    Houssa, Michel  
    ;
    Bescond, M.
    ;
    Garros, X.
    ;
    Leroux, C.
    Proceedings paper
    2004, Integration of Advanced Micro- and Nanoelectronic Devices - Critical Issues and Solutions, 12/04/2004, p.D6.1
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    Electron transport through high-k dielectric barriers: A non-equilibrium Green's function (NEGF) study

    Munteanu, D.
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    Autran, J.L.
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    Moreau, M.
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    Houssa, Michel  
    Journal article
    2009, Journal of Non-Crystalline Solids, (355) 18, p.1180-1184
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    Impact of high-k gate dielectrics on decananometer double-gate MOSFETs: gate-fringing field and parasitic charge effects

    Munteanu, D.
    ;
    Autran, J.L.
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    Bescond, M.
    ;
    Houssa, Michel  
    Proceedings paper
    2004, Proceedings Ultimate Integration of Silicon (ULIS) Workshop, 11/03/2004, p.39-42
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    Investigation of capacitance-voltage characteristics in Ge /high-k MOS devices

    Moreau, M.
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    Munteanu, D.
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    Autran, J.-L.
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    Bellenger, Florence
    ;
    Mitard, Jerome  
    ;
    Houssa, Michel  
    Journal article
    2009, Journal of Non-Crystalline Solids, (355) 18, p.1171-1175

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