Publication:
Impact of high-k gate dielectrics on decananometer double-gate MOSFETs: gate-fringing field and parasitic charge effects
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1856 since deposited on 2021-10-15
Acq. date: 2025-12-08
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Views
1856 since deposited on 2021-10-15
Acq. date: 2025-12-08
Citations