Publication:
Impact of high-k gate dielectrics on decananometer double-gate MOSFETs: gate-fringing field and parasitic charge effects
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1858 since deposited on 2021-10-15
1last month
Acq. date: 2026-04-06
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Statistics
Views
1858 since deposited on 2021-10-15
1last month
Acq. date: 2026-04-06
Citations