Browsing by Author "Nafría, M."
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Publication Channel hot-carrier degradation under static stress in short channel transistors with high-k/metal gate stacks
Proceedings paper2008, 9th International Conference on ULtimate Integration on Silicon - ULIS, 12/03/2008, p.103-106Publication Critical metrology for ultrathin high k dielectrics
Proceedings paper2003, Characterization and Metrology for ULSI Technology, 24/03/2003, p.129-138Publication Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs
Journal article2009, IEEE Transactions on Electron Devices, (56) 5, p.1063-1069