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Critical metrology for ultrathin high k dielectrics
Publication:
Critical metrology for ultrathin high k dielectrics
Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandervorst, Wilfried
;
Brijs, Bert
;
Bender, Hugo
;
Conard, Thierry
;
Petry, Jasmine
;
Richard, Olivier
;
Blasco, X.
;
Nafría, M.
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1987
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1987
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations