Browsing by Author "Nguyen, A.P.D."
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Publication Electrically active defects at the AlN/Si(111) interface studied by DLTS and ESR
Journal article2012, Physica Status Solidi A, (209) 10, p.1851-1856Publication Impact of strain on the passivation efficiency of Ge dangling bond interface defects in condensation grown SiO2/GeSi1-x/SiO2/(100)Si structures with nm-thin GexSi1-x layers
Journal article2014, Applied Surface Science, 291, p.11-15