Publication:
Electrically active defects at the AlN/Si(111) interface studied by DLTS and ESR
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1861 since deposited on 2021-10-20
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Acq. date: 2026-04-28
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Statistics
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1861 since deposited on 2021-10-20
1last month
1last week
Acq. date: 2026-04-28
Citations