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Electrically active defects at the AlN/Si(111) interface studied by DLTS and ESR

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1858 since deposited on 2021-10-20
3last month
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Acq. date: 2026-02-24

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1858 since deposited on 2021-10-20
3last month
2last week
Acq. date: 2026-02-24

Citations