Publication:
Electrically active defects at the AlN/Si(111) interface studied by DLTS and ESR
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1855 since deposited on 2021-10-20
3last month
2last week
Acq. date: 2026-01-26
Citations
Statistics
Views
1855 since deposited on 2021-10-20
3last month
2last week
Acq. date: 2026-01-26
Citations