Publication:
Electrically active defects at the AlN/Si(111) interface studied by DLTS and ESR
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1859 since deposited on 2021-10-20
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Acq. date: 2026-03-17
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Statistics
Views
1859 since deposited on 2021-10-20
3last month
1last week
Acq. date: 2026-03-17
Citations