Browsing by Author "Ni, Kai"
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Publication Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation--Part I: CNFET Transistor Optimization
Journal article2022, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, (30) 4, p.432-439Publication Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation--Part II: CNT Interconnect Optimization
Journal article2022, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, (30) 4, p.440-448Publication Device assessment of electrically active defects in high-mobility materials
Journal article2016, ECS Journal of Solid State Science and Technology, (5) 4, p.P3149-3165Publication Electrical effect of a single extended defect in MOSFETs: a simulation study
Journal article2016, IEEE Transactions on Electron Devices, (63) 8, p.3069-3075Publication On the assessment of electrically active defects in high-mobility materials and devices
Proceedings paper2016, 13th IEEE International Conference on Solid-State and Integrated Circuit Technology - ICSICT, 25/10/2016, p.300-303Publication X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devices
Journal article2018, IEEE Transactions on Nuclear Science, (65) 8, p.1519-1524