Browsing by Author "Nicolett, A.S."
Now showing 1 - 3 of 3
- Results per page
- Sort Options
Publication Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices
Journal article2002, Solid-State Electronics, (46) 9, p.1381-1387Publication Influence of the back gate voltage on the total series resistance of fully depleted SOI MOSFETs at 300 K and 77 K
Proceedings paper2002, Proceedings of the 17th International Symposium on Microelectronics Technology and Devices - SBMICRO, 9/09/2002, p.430-436Publication The influence of the interface trap densities on the extraction of the silicon film and front oxide thickness of SOI NMOS devices at low temperatures
Proceedings paper2002, Proceedings of the 17th International Symposium on Microelectronics Technology and Devices - SBMICRO, 9/09/2002, p.28-34