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The influence of the interface trap densities on the extraction of the silicon film and front oxide thickness of SOI NMOS devices at low temperatures
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1940 since deposited on 2021-10-14
1last month
Acq. date: 2026-02-25
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Statistics
Views
1940 since deposited on 2021-10-14
1last month
Acq. date: 2026-02-25
Citations