Browsing by Author "Nicoletti, Talitha"
Now showing 1 - 9 of 9
- Results Per Page
- Sort Options
Publication Advantages of different source/drain engineering on scaled UTBOX FD SOI nMOSFETs at high temperature operation
Journal article2014, Solid-State Electronics, (91) 1, p.53-58Publication DIBL behavior of triple gate FinFETs with SEG on biaxial strained devices
Proceedings paper2010, Microelectronics Technology and Devices - SBMICRO 2010, 6/09/2010, p.51-58Publication Floating body retention analysis for 1T-DRAM
Proceedings paper2013, SEMINATEC, 2/05/2013Publication Generation rate analysis of different S/D junction engineering in scalted UTBOX 1-T DRAM
Publication Improved retention times in UTBOX nMOSFETs for 1T-DRAM applications
Publication Junction field effect on the retention time for one-transistor floating-body RAM
Journal article2012, IEEE Transactions on Electron Devices, (59) 8, p.2167-2172Publication On the variability of the front-/back-channel LF noise in UTBOX SOI nMOSFETs
Journal article2013, IEEE Transactions on Electron Devices, (60) 1, p.444-450Publication Origin of wide retention distribution in 1T Floating Body RAM
Proceedings paper2012, IEEE International SOI Conference, 1/10/2012, p.6.4Publication Potential and limitations of UTBB SOI for advanced CMOS technologies
Proceedings paper2013, Symposium on Microelectronics Technology and Devices - SBMicro, 3/09/2013, p.306-311