Browsing by Author "Niedermann, P."
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Publication Characterization of conductive probes for atomic force microscopy
Proceedings paper1999, Design, Test, and Microfabrication of MEMS and MOEMS; 30 March - 1 April 1999; Paris, France., 30/03/1999, p.1168-1179Publication Cross-sectional nano-spreading resistance profiling
Journal article1998, Journal of Vacuum Science and Technology B, (16) 1, p.355-361Publication Cross-sectional nano-srp dopant profiling
Proceedings paper1997, 4th International Workshop on the Measurement, Characterization and Modelling of Ultra-Shallow Doping Profiles, 6/04/1997, p.56.1-56.1Publication Evaluating probes for "electrical" atomic force microscopy
Journal article2000, J. Vacuum Science and Technology B, (B18) 1, p.418-427Publication Evaluating probes for "electrical" atomic force microscopy
Proceedings paper1999, Proceedings 5th International Workshop on the Measurement, Characterization, and Modeling of Ultra-Shallow Doping Profiles in Se, 28/03/1999, p.423-436Publication Highly conductive diamond probes for scanning spreading resistance microscopy
Journal article2000, Applied Physics Letters, (76) 12, p.1603-1605Publication Integrating diamond pyramids into metal cantilevers and using them as electrical AFM probes
Journal article2001, Microelectronic Engineering, (57-58) 1_4, p.749-754Publication Mounting of moulded AFM probes by soldering
Proceedings paper2000, Materials and Device Characterization in Micromachining III, 17/09/2000, p.62-73