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Highly conductive diamond probes for scanning spreading resistance microscopy
Publication:
Highly conductive diamond probes for scanning spreading resistance microscopy
Date
2000
Journal article
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4407.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hantschel, Thomas
;
Niedermann, P.
;
Trenkler, Thomas
;
Vandervorst, Wilfried
Journal
Applied Physics Letters
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1931
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1931
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations