Publication:

Highly conductive diamond probes for scanning spreading resistance microscopy

Date

2000
Journal article
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0001-9476-4084
cris.virtualsource.departmente754b012-c4f4-4d96-8cf4-048fae6e57b3
cris.virtualsource.orcide754b012-c4f4-4d96-8cf4-048fae6e57b3
dc.contributor.authorHantschel, Thomas
dc.contributor.authorNiedermann, P.
dc.contributor.authorTrenkler, Thomas
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.date.accessioned2021-10-14T13:02:33Z
dc.date.available2021-10-14T13:02:33Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4415
dc.source.beginpage1603
dc.source.endpage1605
dc.source.issue12
dc.source.journalApplied Physics Letters
dc.source.volume76
dc.title

Highly conductive diamond probes for scanning spreading resistance microscopy

dc.typeJournal article
dspace.entity.typePublication
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