Browsing by Author "Nissimoff, Albert"
Now showing 1 - 4 of 4
- Results Per Page
- Sort Options
Publication Improved retention times in UTBOX nMOSFETs for 1T-DRAM applications
;Sasaki, Katia ;Nicoletti, Talitha ;Almeida, Luciano ;Dos Santos, SaraNissimoff, AlbertJournal article2014, Solid-State Electronics, 97, p.30-37Publication Observation of the two-sided read window on UTBOX SOI 1T-DRAM: measurement setup, numerical and empirical results
Journal article2014, Journal of Integrated Circuits and Systems, (9) 2, p.91-96Publication Semiconductor film bandgap influence on retention time of UTBOX SOI 1T-FBRAM
Proceedings paper2013, Advanced Semiconductor-on-Insulator Technology and Related Physics 16, 12/05/2013, p.139-146Publication Spike anneal peak temperature impact on 1T-DRAM retention time
Journal article2014, IEEE Electron Device Letters, (35) 6, p.639-641