Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Spike anneal peak temperature impact on 1T-DRAM retention time
Publication:
Spike anneal peak temperature impact on 1T-DRAM retention time
Copy permalink
Date
2014
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nissimoff, Albert
;
Martino, Joao A.
;
Aoulaiche, Marc
;
Veloso, Anabela
;
Witters, Liesbeth
;
Simoen, Eddy
;
Claeys, Cor
Journal
IEEE Electron Device Letters
Abstract
Description
Metrics
Views
1867
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-12
Citations
Metrics
Views
1867
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-12
Citations