Publication:
Spike anneal peak temperature impact on 1T-DRAM retention time
Date
| dc.contributor.author | Nissimoff, Albert | |
| dc.contributor.author | Martino, Joao A. | |
| dc.contributor.author | Aoulaiche, Marc | |
| dc.contributor.author | Veloso, Anabela | |
| dc.contributor.author | Witters, Liesbeth | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Veloso, Anabela | |
| dc.contributor.imecauthor | Witters, Liesbeth | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-22T04:19:19Z | |
| dc.date.available | 2021-10-22T04:19:19Z | |
| dc.date.issued | 2014 | |
| dc.identifier.issn | 0741-3106 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24325 | |
| dc.identifier.url | http://ieeexplore.ieee.org/xpl/abstractAuthors.jsp?reload=true&arnumber=6811203&sortType%3Dasc_p_Sequence%26filter%3DAND(p_Publi | |
| dc.source.beginpage | 639 | |
| dc.source.endpage | 641 | |
| dc.source.issue | 6 | |
| dc.source.journal | IEEE Electron Device Letters | |
| dc.source.volume | 35 | |
| dc.title | Spike anneal peak temperature impact on 1T-DRAM retention time | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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