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Browsing by Author "Nistor, L."

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    A microstructural study of the thermal stability of atomic layer deposited Al2O3 thin films

    Nistor, L.
    ;
    Richard, Olivier  
    ;
    Zhao, Chao
    ;
    Bender, Hugo  
    ;
    Stesmans, Andre  
    ;
    Van Tendeloo, G.
    Proceedings paper
    2003-04, Microscopy of Semiconducting Materials 2003, 31/03/2003, p.397-400
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    Engineering of an insulating buffer and use of AIN interlayers: two optimisations for AlGaN-GaN HEMT-like structures

    Bougrioua, Z.
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    Moerman, Ingrid  
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    Nistor, L.
    ;
    Monroy, E.
    ;
    Calle, F.
    Meeting abstract
    2002, EXMATEC - Expert Evaluation and Control of Compound Semiconductor Materials and Technologies, 26/05/2002
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    Engineering of an insulating buffer and use of AIN interlayers: two optimisations for AlGaN-GaN HEMT-like structures

    Bougrioua, Z.
    ;
    Moerman, Ingrid  
    ;
    Nistor, L.
    ;
    Van Daele, B.
    ;
    Monroy, E.
    ;
    Palacios, T.
    ;
    Calle, F.
    Journal article
    2003, Physica Status Solidi A, (195) 1, p.93-100
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    Imaging of H2 bubbles and the related strain field in silicon wafers exposed to RF hydrogen plasma

    Ghica, C.
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    Nistor, L.
    ;
    Richard, Olivier  
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    Bender, Hugo  
    ;
    Ulyashin, Aliaksandr
    ;
    Van Tendeloo, G.
    Proceedings paper
    2004, Proceedings of the 13th European Microscopy Congress. Volume 2: Materials Sciences, 22/08/2004, p.395-396
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    Structural characterisation of advanced silicides

    Bender, Hugo  
    ;
    Richard, Olivier  
    ;
    Nistor, L.
    ;
    Gutakovskii, A.
    ;
    Stuer, C.
    ;
    Detavernier, C.
    Proceedings paper
    2003-04, Microscopy of Semiconducting Materials 2003, 31/03/2003, p.453-462

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