Browsing by Author "O'Sullivan, Barry J."

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Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution

Van Beek, Simon
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Rao, Siddharth
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Kundu, Shreya
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Kim, Woojin
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O'Sullivan, Barry J.
;
Cosemans, Stefan
Proceedings paper
2021, IEEE International Reliability Physics Symposium (IRPS), MAR 21-24, 2021
Impact of Interface Layer on Device Characteristics of Si:HfO2-Based FeFET's

Jung, Taehwan
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O'Sullivan, Barry J.
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Ronchi, Nicolo
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Linten, Dimitri
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Shin, Changhwan
Journal article
2021, IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, (21) 2, p.176-182