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Browsing by Author "Ohyama, H."

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    A model for the radiation degradation of polycrystalline silicon films

    Ohyama, H.
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    Nakabayashi, M.
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    Takakura, K.
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    Simoen, Eddy  
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    Takami, Y.
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    Claeys, Cor
    Oral presentation
    2002, RADECS Workshop
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    A study on radiation damage of IGBTs 2-MeV electrons at different temperatures

    Nakabayashi, M.
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    Ohyama, H.
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    Hanano, N.
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    Kamiya, T.
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    Hirao, T.
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    Simoen, Eddy  
    ;
    Claeys, Cor
    Proceedings paper
    2004, Proceedings 7th European Conference on Radiation and its Effects on Components and Systems, 15/09/2003, p.433-437
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    A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures

    Nakabayashi, M.
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    Ohyama, H.
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    Hanano, N.
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    Kamiya, T.
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    Hirao, T.
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    Takakura, K.
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    Simoen, Eddy  
    Journal article
    2004, Nuclear Instruments & Methods in Physics Research B, 219-220, p.676-679
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    A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures

    Ohyama, H.
    ;
    Claeys, Cor
    ;
    Nakabayashi, H.
    ;
    Masakazu, T.
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    Simoen, Eddy  
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    Hanano, M.
    ;
    Naotika, F.
    Oral presentation
    2003, 7th European Conference on Radiation and Its Effects on Components and Systems - RADECS
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    Anomalous threshold voltage change by 2 MeV electron irradiation at 100°C in deep submicron metal-oxide-semiconductor field-effect transistors

    Hayama, K.
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    Ohyama, H.
    ;
    Simoen, Eddy  
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    Rafi, Joan Marc
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    Mercha, Abdelkarim  
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    Claeys, Cor
    Journal article
    2004-04, Applied Physics Letters, 84, p.3088-3090
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    Body potential analysis of ultra thin gate oxide FD-SOI MOSFETs in accumulation mode operation

    Hayama, K.
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    Takakura, K.
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    Ohyama, H.
    ;
    Rafi, J.M.
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    Mercha, Abdelkarim  
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Journal article
    2005, Journal of Materials Science: Materials in Electronics, (16) 7, p.459-462
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    Carrier lifetime analysis in thin gate oxide FD-SOI n-MOSFETs by gate-induced drain current tranients

    Hayama, K.
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    Takakura, K.
    ;
    Ohyama, H.
    ;
    Rafi, J.M.
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    Mercha, Abdelkarim  
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Journal article
    2008, Journal of Materials Science: Materials in Electronics, (19) 2, p.161-165
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    Carrier lifetime evaluation of electron irradiated SiGe/Si diode

    Idemoto, T.
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    Ohyama, H.
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    Takakura, K.
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    Tsunoda, I.
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    Yoneoka, M.
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    Nakashima, T.
    Proceedings paper
    2010, 2nd Semiconductor Materials and Devices Forum - SMDF-2, 11/12/2010, p.154-155
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    Carrier lifetime studies in diode structures on Si substrates with and without Ge doping

    Uleckas, A.
    ;
    Gaubas, E.
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    Rafi, J.M.
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    Chen, J.
    ;
    Yang, D.
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    Ohyama, H.
    ;
    Simoen, Eddy  
    ;
    Vanhellemont, J.
    Journal article
    2011, Solid State Phenomena, 178-179, p.347-352
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    Comparison of electron irradiation effect on thermal donors in Cz and oxygen doped FZ silicon

    Takakura, K.
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    Ohyama, H.
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    Yoshida, T.
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    Murakawa, H.
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    Rafi, Joan Marc
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    Job, R.
    ;
    Ulyashin, A.
    Journal article
    2003, Physica B, 340-342, p.1022-1025
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    Comparison of electron irradiation effects on diodes fabricated on silicon and on germanium doped silicon substrates

    Ohyama, H.
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    Rafi, J.M.
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    Campabadal, F.
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    Takakura, K.
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    Simoen, Eddy  
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    Chen, J.
    ;
    Vanhellemont, J.
    Journal article
    2009, Physica B: Condensed Matter, (404) 23_24, p.4671-4673
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    Damage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodes

    Ohyama, H.
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    Takakura, K.
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    Hayama, K.
    ;
    Kuboyama, S.
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    Deguchi, Y.
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    Matsuda, S.
    ;
    Simoen, Eddy  
    Journal article
    2003, Applied Physics Letters, (82) 2, p.296-298
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    Degradation and their recovery behavior of irradiated GaAlAs LEDs

    Ohyama, H.
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    Takakura, K.
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    Nagano, T.
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    Hanada, M.
    ;
    Kuboyama, S.
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    Simoen, Eddy  
    ;
    Claeys, Cor
    Proceedings paper
    2008, Gettering and Defect Engineering in Semiconductor Technology XII, 14/10/2007, p.119-124
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    Degradation behavior for high-temperature irradiated npn Si transistors

    Ohyama, H.
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    Takakura, T.
    ;
    Nishiyana, E.
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    Simoen, Eddy  
    ;
    Claeys, Cor
    Proceedings paper
    2002, Proceedings 5th International Workshop on Radiation Effects in Semiconductor Devices for Space Applications, 9/10/2002, p.89-92
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    Degradation behaviors for high temperature irradiated NPN Si transistors

    Ohyama, H.
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    Takakura, K.
    ;
    Nishiyama, K.
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    Simoen, Eddy  
    ;
    Claeys, Cor
    Proceedings paper
    2002, Proceedings of the 5th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, 9/10/2002, p.89-92
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    Degradation of drain current hysteresis in electron-irradiated FD-SOI MOSFETs in accumulation mode operation

    Hayama, K.
    ;
    Takakura, K.
    ;
    Ohyama, H.
    ;
    Rafi, J.M.
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    Mercha, Abdelkarim  
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Proceedings paper
    2005, Proceedings of the International Conference on Electrical Engineering - ICEE, 10/07/2005
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    Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation

    Hayama, K.
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    Takakura, K.
    ;
    Ohyama, H.
    ;
    Mercha, Abdelkarim  
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    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Rafi, J.M.
    Journal article
    2004, Microelectronics Reliability, (44) 9_11, p.1721-1726
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    Degradation of high resistivity silicon float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation

    Rafi, J.M.
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    Boulord, C.
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    Hayama, K.
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    Ohyama, H.
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    Campabadal, F.
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    Pellegrini, G.
    ;
    Lozano, M.
    Oral presentation
    2008, 8th International Conference on Position Sensitive Detectors
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    Degradation of high-resistivity float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation

    Rafi, J.M.
    ;
    Boulord, C.
    ;
    Hayama, K.
    ;
    Ohyama, H.
    ;
    Campabadal, F.
    ;
    Pellegrini, G.
    ;
    Lozano, M.
    Journal article
    2009, Nuclear Instruments and Methods in Physics Research A, 604, p.258-261
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    Degradation of SiC-MESFETs by irradiation

    Ohyama, H.
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    Takakura, K.
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    Uemura, K.
    ;
    Shigaki, K.
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    Kudou, T.
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    Matsumoto, T.
    ;
    Arai, M.
    ;
    Kuboyama, S.
    Journal article
    2008, Journal of Materials Science: Materials in Electronics, (19) 2, p.175-178
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