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Carrier lifetime analysis in thin gate oxide FD-SOI n-MOSFETs by gate-induced drain current tranients
Publication:
Carrier lifetime analysis in thin gate oxide FD-SOI n-MOSFETs by gate-induced drain current tranients
Date
2008
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hayama, K.
;
Takakura, K.
;
Ohyama, H.
;
Rafi, J.M.
;
Mercha, Abdelkarim
;
Simoen, Eddy
;
Claeys, Cor
Journal
Journal of Materials Science: Materials in Electronics
Abstract
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Views
1952
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1952
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations