Browsing by Author "Okawa, Hiroshi"
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Publication Defect profiling and the role of nitrogen in lanthanum oxide-capped high-k dielectrics for nMOS applications
Proceedings paper2008-09, International Conference on Solid State Devices and Materials - SSDM, 24/09/2008, p.680-681Publication Quantification of MOSFET device reliability with low-Vt lanthanum-incorporated high permittivity dielectrics
Journal article2009, Journal of Applied Physics, (106) 11, p.114504