Browsing by Author "Oliveira, Alberto V."
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Publication GR-noise characterization of Ge pFinFETs with STI first and STI last process
Journal article2016, IEEE Electron Device Letters, (37) 9, p.1092-1095Publication On the assessment of electrically active defects in high-mobility materials and devices
Proceedings paper2016, 13th IEEE International Conference on Solid-State and Integrated Circuit Technology - ICSICT, 25/10/2016, p.300-303Publication Split-CV mobility at low temperature operation of Ge pFinFETs fabricated with STI first and last process
Journal article2016, Semiconductor Science and Technology, (31) 11, p.114002