Browsing by Author "Oosterbos, Giel"
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Publication Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study
Journal article2022, JOURNAL OF APPLIED PHYSICS, (132) 7, p.074901Publication Post-Ionization of Silicon Clusters in Atom Probe Microscopy: A Joint Theoretical and Experimental Investigation.
Oral presentation2019, European Atom Probe Workshop 2019