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Articles
Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study
Publication:
Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study
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Date
2022
Journal article
https://doi.org/10.1063/5.0106692
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3.71 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cuduvally, Ramya
;
Morris, Richard
;
Oosterbos, Giel
;
Ferrari, Piero
;
Fleischmann, Claudia
;
Forbes, Richard G.
;
Vandervorst, Wilfried
Journal
JOURNAL OF APPLIED PHYSICS
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222
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1324
since deposited on 2022-12-06
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Downloads
222
since deposited on 2022-12-06
34
last month
7
last week
Acq. date: 2025-12-15
Views
1324
since deposited on 2022-12-06
3
last month
Acq. date: 2025-12-15
Citations