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Articles
Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study
Publication:
Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study
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Date
2022
Journal article
https://doi.org/10.1063/5.0106692
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cuduvally, Ramya
;
Morris, Richard
;
Oosterbos, Giel
;
Ferrari, Piero
;
Fleischmann, Claudia
;
Forbes, Richard G.
;
Vandervorst, Wilfried
Journal
JOURNAL OF APPLIED PHYSICS
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Downloads
279
since deposited on 2022-12-06
23
last month
4
last week
Acq. date: 2026-02-25
Views
1326
since deposited on 2022-12-06
2
last month
1
last week
Acq. date: 2026-02-25
Citations