Publication:

Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study

Date

2022
Journal article
https://doi.org/10.1063/5.0106692
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dc.contributor.authorCuduvally, Ramya
dc.contributor.authorMorris, Richard
dc.contributor.authorOosterbos, Giel
dc.contributor.authorFerrari, Piero
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorForbes, Richard G.
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorCuduvally, Ramya
dc.contributor.imecauthorMorris, Richard
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecMorris, Richard::0000-0002-0902-7088
dc.date.accessioned2023-04-12T08:19:11Z
dc.date.available2022-12-06T03:08:17Z
dc.date.available2023-04-12T08:19:11Z
dc.date.embargo2023-08-16
dc.date.issued2022
dc.description.wosFundingTextR.C., R.J.H.M., C.F., and W.V. acknowledge the financial support from FWO-Hercules through Project No. ZW13_09. P.F. acknowledges the Research Foundation Flanders (FWO) for a senior postdoctoral grant.
dc.identifier.doi10.1063/5.0106692
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40831
dc.publisherAIP Publishing
dc.source.beginpage074901
dc.source.endpagena
dc.source.issue7
dc.source.journalJOURNAL OF APPLIED PHYSICS
dc.source.numberofpages13
dc.source.volume132
dc.subject.keywordsEVAPORATED IONS
dc.subject.keywordsSTATE
dc.title

Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study

dc.typeJournal article
dspace.entity.typePublication
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