Browsing by Author "Palumbo, Felix"
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Publication Defect spectroscopy from electrical measurements: a simulation based technique
Proceedings paper2018, 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference - EDTM, 13/03/2018, p.145-147Publication Hf-based high-k dielectrics for p-Ge MOS gate stacks
Journal article2014, Journal of Vacuum Science and Technology B, (32) 3, p.03D105Publication Standards for the Characterization of Endurance in Resistive Switching Devices
Journal article review2021, ACS NANO, (15) 11, p.17214-17231Publication Temperature of Conductive Nanofilaments in Hexagonal Boron Nitride Based Memristors Showing Threshold Resistive Switching
Journal article2022, ADVANCED ELECTRONIC MATERIALS, (8) 8, p.2100580