Browsing by Author "Pangon, Nadège"

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Roussel, Philippe

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Maes, Herman

Oral presentation

1998, 29th IEEE Semiconductor Interface Specialists Conference - SISC; 3-5 Dec. 1998; San Diego, CA, USA.

Publication

Investigation of properties of SiO2 defects created during electric stressing at different temperatures

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Pangon, Nadège

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Oral presentation

1999, Semiconductor Interface Specialists' Conference; December 1999; Charleston, SC, USA.

Publication

Investigation of temperature acceleration of thin oxide time-to-breakdown

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Pangon, Nadège

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Nigam, Tanya

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Journal article

1999, Microelectronic Engineering, (48) 1_4, p.47-50

Publication

Temperature acceleration of oxide breakdown and its impact on ultra-thin gate oxide reliability

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Pangon, Nadège

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Nigam, Tanya

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Naem, Abdalla

Proceedings paper

1999, Symposium on VLSI Technology: Technical Digest; June 1999; Kyoto, Japan., p.59-60

Publication

The effect of elevated temperature on the reliability of very thin oxide films

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Pangon, Nadège

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Nigam, Tanya

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Proceedings paper

1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.356-359

Publication

The influence of elevated temperature on degradation and lifetime prediction of thin silicon-dioxide films

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Pangon, Nadège

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