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The influence of elevated temperature on degradation and lifetime prediction of thin silicon-dioxide films
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The influence of elevated temperature on degradation and lifetime prediction of thin silicon-dioxide films
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Date
2000
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kaczer, Ben
;
Degraeve, Robin
;
Pangon, Nadège
;
Groeseneken, Guido
Journal
IEEE Trans. Electron Devices
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1902
since deposited on 2021-10-14
3
last month
1
last week
Acq. date: 2025-12-11
Citations
Metrics
Views
1902
since deposited on 2021-10-14
3
last month
1
last week
Acq. date: 2025-12-11
Citations