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Investigation of properties of SiO2 defects created during electric stressing at different temperatures
Publication:
Investigation of properties of SiO2 defects created during electric stressing at different temperatures
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Date
1999
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kaczer, Ben
;
Degraeve, Robin
;
Pangon, Nadège
;
Groeseneken, Guido
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1919
since deposited on 2021-10-06
3
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Acq. date: 2025-12-11
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Metrics
Views
1919
since deposited on 2021-10-06
3
last month
Acq. date: 2025-12-11
Citations