Browsing by Author "Pantelides, Sokrates"
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Publication Activation energies for oxide- and interface-trap charge generation due to negative-bias--temperature stress of Si-capped SiGe-pMOSFETs
Journal article2015-09, IEEE Transactions on Device and Materials Reliability, (15) 3, p.352-357Publication Effects of negative-bias-temperature-instability on low-frequency noise in SiGe p MOSFETs
Publication Total ionizing dose effects on strained Ge pMOS FinFETs on bulk Si
Meeting abstract2016-07, IEEE Nuclear Space and Radiation Conference - NSREC, 13/07/2016