Repository logo Institutional repository
  • Communities & Collections
  • Scientific publicationsOpen knowledge
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Park, Jin-Goo"

Filter results by typing the first few letters
Now showing 1 - 14 of 14
  • Results per page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Acidic cleaning solutions for post InGaAs CMP cleaning

    Park, Jin-Goo
    ;
    Purushothaman, Muthukrishnan
    ;
    Lee, Jung-Hwan
    ;
    Choi, In-chan
    ;
    Kim, Hyun-Tae
    Proceedings paper
    2018-04, 20th Surface Preparation and Cleaning Conference - SPCC 2018, 9/04/2018
  • Loading...
    Thumbnail Image
    Publication

    Analyzing the collapse force determined using lateral force AFM using

    Wostyn, Kurt  
    ;
    Kim, Tae-Gon
    ;
    Park, Jin-Goo
    ;
    Mertens, Paul  
    Meeting abstract
    2008, Ultra Clean Processing of Semiconductor Surfaces 2008, 22/09/2008
  • Loading...
    Thumbnail Image
    Publication

    Analyzing the collapse force determined using lateral force AFM using mechanics theory

    Wostyn, Kurt  
    ;
    Kim, Tae-Gon
    ;
    Park, Jin-Goo
    ;
    Mertens, Paul  
    Oral presentation
    2008, 9th International Symposium on Ultra Clean Processing Of Semiconductor Surfaces
  • Loading...
    Thumbnail Image
    Publication

    Analyzing the collapse force of narrow lines measured by lateral force AFM using an analytical mechanical model

    Wostyn, Kurt  
    ;
    Kim, Tae-Gon
    ;
    Mertens, Paul  
    ;
    Park, Jin-Goo
    Journal article
    2009, Solid State Phenomena, 145-146, p.55-58
  • Loading...
    Thumbnail Image
    Publication

    Collapse behavior and forces of multistack nanolines

    Kim, Tae-Gon
    ;
    Wostyn, Kurt  
    ;
    Mertens, Paul  
    ;
    Busnaina, Ahmed A.
    ;
    Park, Jin-Goo
    Journal article
    2010, Nanotechnology, (21) 1, p.15708
  • Loading...
    Thumbnail Image
    Publication

    Development of post InGaAs CMP cleaning process for sub 10 nm device application

    Purushothaman, Muthukrishnan
    ;
    Choi, In-chan
    ;
    Kim, Hyun-Tae
    ;
    Teugels, Lieve  
    ;
    Kim, Tae-Gon
    Meeting abstract
    2017-10, International Conference on Planarization/CMP Technology - ICPT, 11/10/2017
  • Loading...
    Thumbnail Image
    Publication

    Development of post InGaAs CMP cleaning process for sub 10nm device application

    Purushothaman, Muthukrishnan
    ;
    Choi, In-Chan
    ;
    Kim, Hyun-Tae
    ;
    Teugels, Lieve  
    ;
    Kim, Tae-Gon
    Proceedings paper
    2017-10, International Conference on Planarization/CMP Technology - ICPT, 11/10/2017
  • Loading...
    Thumbnail Image
    Publication

    Effect of ammonium halide salts on wet chemical nanoscale etching and polishing of InGaAs surfaces for advanced CMOS devices

    Samanta, Suprakash
    ;
    Jin, Seungwan
    ;
    Lee, Chan-Hee
    ;
    Lee, Seong-Soo
    ;
    Struyf, Herbert  
    ;
    Kim, Tae-Gon
    Journal article
    2023, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, (161) July, p.Art. 07469
  • Loading...
    Thumbnail Image
    Publication

    Effects of H2O2 and pH on the Chemical Mechanical Planarization of Molybdenum

    Ryu, Heon-Yul
    ;
    Teugels, Lieve  
    ;
    Devriendt, Katia  
    ;
    Struyf, Herbert  
    ;
    Kim, Tae-Gon
    ;
    Park, Jin-Goo
    Journal article
    2021, ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, (10) 9, p.094001
  • Loading...
    Thumbnail Image
    Publication

    Effects of interfacial strength and dimension of structures on physical cleaning window

    Kim, Tae-Gon
    ;
    Pacco, Antoine  
    ;
    Wostyn, Kurt  
    ;
    Xu, XiuMei  
    ;
    Struyf, Herbert  
    ;
    Arstila, Kai
    ;
    Park, Jin-Goo
    Meeting abstract
    2010, 10th International Symposium on Ultra-Clean Processing of Semiconductor Devices - UCPSS, 19/10/2010, p.10-11
  • Loading...
    Thumbnail Image
    Publication

    Investigation of physical cleaning process window by atomic force microscope

    Kim, Tae-Gon
    ;
    Wostyn, Kurt  
    ;
    Bearda, Twan
    ;
    Park, Jin-Goo
    ;
    Mertens, Paul  
    ;
    Heyns, Marc  
    Meeting abstract
    2009-10, 216th ECS Meeting, 5/10/2009, p.2079
  • Loading...
    Thumbnail Image
    Publication

    Pattern collapse and particle removal forces of interest to semiconductor fabrication process

    Kim, Tae-Gon
    ;
    Wostyn, Kurt  
    ;
    Park, Jin-Goo
    ;
    Mertens, Paul  
    ;
    Busnaina, Ahmed
    Journal article
    2009, Solid State Phenomena, 145-146, p.47-50
  • Loading...
    Thumbnail Image
    Publication

    Quantitative measurement of pattern collapse and particle removal force

    Kim, Tae-Gon
    ;
    Wostyn, Kurt  
    ;
    Mertens, Paul  
    ;
    Busnaina, Ahmed
    ;
    Park, Jin-Goo
    Proceedings paper
    2007, Cleaning and Surface Conditioning Technology in Semiconductor Device Manufacturing 10, 7/10/2007, p.123-129
  • Loading...
    Thumbnail Image
    Publication

    Tackling the challenges of physical cleaning

    Wostyn, Kurt  
    ;
    Janssens, Tom
    ;
    Zijlstra, Aaldert
    ;
    Wada, Masayuki
    ;
    Andreas, Michael
    ;
    Kim, Tae-Gon
    Oral presentation
    2008, 8th International Surface Cleaning Users Group Meeting Cleaning Technology Symposium

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings