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Browsing by Author "Park, Min Hyuk"

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    Effect of annealing ferroelectric HfO2 thin films: In situ, high temperature X-ray diffraction

    Park, Min Hyuk
    ;
    Chung, Ching-Chang
    ;
    Schenk, Tony
    ;
    Richter, Claudia
    ;
    Opsomer, Karl  
    Journal article
    2018, Advanced Electronic Materials, (4) 7, p.1800091-1-1800091-10
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    Reliability of HfO2-based FeFET memory

    Ichihara, Reika
    ;
    Pesic, Milan D.
    ;
    Higashi, Yusuke  
    ;
    Park, Min Hyuk
    Journal article review
    2025-09-16, MRS BULLETIN, (50) 9, p.1053-1065

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