Publication:

Reliability of HfO2-based FeFET memory

Date

2025

Journal Article Review

https://doi.org/10.1557/s43577-025-00967-y

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Author(s)

Ichihara, Reika

;

Pesic, Milan D.

;

Higashi, Yusuke

;

Journal

MRS BULLETIN

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Acq. date: 2026-07-16